American Journal of Roentgenology Online -- Index by Author (1 April 2000, 174, Number 4)

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Index by Author: 1 April 2000; 174 (4) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z |

A: Acinas, O. [Abstract] [Full Text]; Adelstein, David J. [Abstract] [Full Text]; Alavi, Abass [Full Text]; Arai, Yasuaki [Abstract] [Full Text]; Armao, Diane [Full Text]; Armao, Diane [Full Text]; Arrivé, Lionel [Abstract] [Full Text]
B: Bader, Till R. [Abstract] [Full Text]; Baker, Mark E. [Abstract] [Full Text]; Berger, Kevin L. [Abstract] [Full Text]; Berlin, Jonathan W. [Full Text]; Berlin, Leonard [Full Text]; Biousse, Valérie [Abstract] [Full Text]; Blachere, H. [Abstract] [Full Text]; Bober, Stewart E. [Full Text]; Boland, Giles W. L. [Abstract] [Full Text]; Boukhelifa, Mokran [Abstract] [Full Text]; Bousson, Valérie [Abstract] [Full Text]; Boutry, Nathalie [Abstract] [Full Text]; Braeuning, M. Patricia [Abstract] [Full Text]; Brody, Jeffrey M. [Abstract] [Full Text]; Brouwers-Kuyper, Elise M. J. [Abstract] [Full Text]; Brunereau, Laurent [Abstract] [Full Text]; Bueno, J. [Abstract] [Full Text]; Bui-Mansfield, Liem T. [Full Text]; Burke, Eithne [Abstract] [Full Text]; Burke, Gregory L. [Abstract] [Full Text]; Burns, C. B. [Abstract] [Full Text]
C: Caoili, Elaine M. [Full Text]; Carr, J. Jeffrey [Abstract] [Full Text]; Chan, Fu-Luk [Abstract] [Full Text]; Chan, Kwong-leung [Abstract] [Full Text]; Chastanet, Patrick [Abstract] [Full Text]; Cheng, Wei [Abstract] [Full Text]; Chew, Felix S. [Full Text]; Chim, C. S. [Abstract] [Full Text]; Chung, Hsiao-Wen [Abstract] [Full Text]; Chung, Jae-Joon [Full Text]; Chung, Sun Yang [Full Text]; Cohan, Richard H. [Abstract] [Full Text]; Cohen, Michael A. [Abstract] [Full Text]; Corl, Frank [Full Text]; Costello, Joanna M. [Abstract] [Full Text]; Cotten, Anne [Abstract] [Full Text]; Couffinhal, T. [Abstract] [Full Text]; Covey, Anne M. [Abstract] [Full Text]; Crouse, John R. III [Abstract] [Full Text]
D: D'Agostino, Ralph B. Jr. [Abstract] [Full Text]; Dallapiccola, B [Full Text]; Davison, Brian D. [Abstract] [Full Text]; De Vuyst, Dimitri [Full Text]; Debatin, Jörg F. [Abstract] [Full Text]; Deck, Andrew J. [Full Text]; Dee, Katherine E. [Full Text]; Dehdashti, Farrokh [Abstract] [Full Text]; Delfaut, Emmanuelle [Abstract] [Full Text]; DeLong, David M. [Abstract] [Full Text]; Demondion, Xavier [Abstract] [Full Text]; Dietrich, Christoph F. [Full Text]; Digilio, MC [Full Text]; Disler, David G. [Full Text]; Djouhri, Hocine [Abstract] [Full Text]; Donnelly, Lane F. [Full Text]
E: Eickmeyer, F. [Abstract] [Full Text]; Eisenberg, Peter [Abstract] [Full Text]; Ellis, James D. [Abstract] [Full Text]; Ellis, Peter K. [Full Text]; Entzian, Dirk [Abstract] [Full Text]
F: Fabrizii, Veronika [Abstract] [Full Text]; Fariñas, M. C. [Abstract] [Full Text]; Fatuga, Gbolahan A. [Abstract] [Full Text]; Fenlon, Helen [Abstract] [Full Text]; Fernández, M. A. [Abstract] [Full Text]; Fiedler, V. [Abstract] [Full Text]; Fischman, Alan J. [Abstract] [Full Text]; Fishman, Elliot K. [Full Text]; Fishman, Elliot K. [Full Text]; Forman, Howard Paul [Abstract] [Full Text]; Francis, Isaac R. [Abstract] [Full Text]
G: Garland, Melissa [Full Text]; Ghate, Sujata [Full Text]; Giannotti, A [Full Text]; Goff, David C. Jr. [Abstract] [Full Text]; Gore, Richard M. [Full Text]; Goswami, Gaurav K. [Full Text]; Gougeon, François [Abstract] [Full Text]; Graf, B. [Abstract] [Full Text]; Green, Andrew [Abstract] [Full Text]; Güezmes, A. [Abstract] [Full Text]; Guillon, Benoît [Abstract] [Full Text]; Günther, Rolf W. [Abstract] [Full Text]; Gupta, Ashok K. [Abstract] [Full Text]
H: Haage, Patrick [Abstract] [Full Text]; Hall, Beverly [Abstract] [Full Text]; Halpern, Elkan F. [Abstract] [Full Text]; Hanson, Julian [Full Text]; Hany, Thomas F. [Abstract] [Full Text]; Harewood, Lawrence [Abstract] [Full Text]; Harner, Christopher D. [Abstract] [Full Text]; Haskal, Ziv J. [Full Text]; Hillman, Bruce J. [Full Text]; Holliday, Joseph [Abstract] [Full Text]; Hori, Masatoshi [Abstract] [Full Text]; Hosaka, M [Full Text]; Hoshi, Hiroaki [Abstract] [Full Text]; Hoshi, Hiroaki [Abstract] [Full Text]; Huang, Yih-Hwen [Abstract] [Full Text]; Hübner, Dolores [Abstract] [Full Text]
I: Ikai, Iwao [Full Text]; Inaba, Yoshitaka [Abstract] [Full Text]; Ishikawa, Tohru [Full Text]; Itai, Yuji [Abstract] [Full Text]; Itch, Harumi [Full Text]; Ito, H [Full Text]; Itoh, Kyo [Full Text]
J: John, AS [Full Text]; Jones, Elizabeth A. [Full Text]
K: Kamin, Daniel S. [Abstract] [Full Text]; Kanematsu, Masayuki [Abstract] [Full Text]; Kanematsu, Masayuki [Abstract] [Full Text]; Kawaguchi, Atsua [Full Text]; Kelly, Ian M. G. [Full Text]; Kerstein, MD [Full Text]; Kim, Jung-Sik [Abstract] [Full Text]; Kim, Myeong-Jin [Full Text]; Kim, Tonsok [Abstract] [Full Text]; Kliewer, Mark A. [Abstract] [Full Text]; Kliewer, Mark A. [Full Text]; Kondo, Hiroshi [Abstract] [Full Text]; Konishi, Junji [Full Text]; Korobkin, Melvyn [Abstract] [Full Text]; Krinsky, Glenn A. [Full Text]; Kronzon, Itzhak [Full Text]; Kubota, Y [Full Text]; Kurihara, Yasuyuki [Full Text]; Kwong, Y. L. [Abstract] [Full Text]
L: Ladd, Mark [Abstract] [Full Text]; Lam, Wendy Wai-man [Abstract] [Full Text]; Langer, Jill [Full Text]; Lanser, Marc E. [Abstract] [Full Text]; Lapègue, Franck [Abstract] [Full Text]; Latrabe, V. [Abstract] [Full Text]; Laufer, Igor [Abstract] [Full Text]; Laurent, F. [Abstract] [Full Text]; Leccia, F. [Abstract] [Full Text]; Lee, Hee-Jung [Abstract] [Full Text]; Lee, Michael J. [Abstract] [Full Text]; Lee, Vivian S. [Full Text]; Leonidas, John C. [Full Text]; Levine, Marc S. [Abstract] [Full Text]; Lévy, Claude [Abstract] [Full Text]; Liang, R. [Abstract] [Full Text]; Lillemoe, Keith D. [Full Text]; Lin, Yuhua [Abstract] [Full Text]; Lu, David S. K. [Abstract] [Full Text]
M: Maeda, Masayuki [Full Text]; Maeyama, Shiro [Full Text]; Maki, Daniel D. [Full Text]; Marino, B [Full Text]; Matar, Luke D. [Full Text]; Matsueda, Kiyoshi [Abstract] [Full Text]; Matsuo, Masayuki [Abstract] [Full Text]; Matthies, Alexander [Full Text]; May, David A. [Full Text]; McAdams, H. Page [Full Text]; McClennan, Bruce L. [Full Text]; McClure, Mark J. [Full Text]; McCormick, Rachel [Full Text]; McGovern, Martin [Full Text]; Miller, Frank H. [Full Text]; Miyazaki, M [Full Text]; Montaudon, M. [Abstract] [Full Text]; Mori, Masaki [Full Text]; Mueller, Peter R. [Abstract] [Full Text]; Mukherji, Suresh K. [Full Text]; Mukherji, Suresh K. [Full Text]; Murakami, Takamichi [Abstract] [Full Text]; Myers, Cris P. [Full Text]
N: Nakagawa, K [Full Text]; Nakajima, Yasuo [Full Text]; Nakamura, Hironobu [Abstract] [Full Text]; Nelson, Rendon C. [Abstract] [Full Text]; Nicholson, Siobhan A. [Abstract] [Full Text]; Nisenbaum, Harvey L. [Full Text]
O: O'Malley, Martin [Abstract] [Full Text]; Obdeijn, Inge-Marie A. [Abstract] [Full Text]; Obuchowski, Nancy [Abstract] [Full Text]; Ooi, G. C. [Abstract] [Full Text]; Oudkerk, Matthijs [Abstract] [Full Text]
P: Parra, J. A. [Abstract] [Full Text]; Patanakar, Tufail [Full Text]; Patanakar, Tufail [Full Text]; Paulson, Erik K. [Abstract] [Full Text]; Paulson, Erik K. [Full Text]; Pearce, David A. [Full Text]; Pereles, F. Scott [Full Text]; Peterson, Neil P. [Abstract] [Full Text]; Petrella, Jeffrey R. [Full Text]; Petty, Brent G. [Full Text]; Pfammatter, Thomas [Abstract] [Full Text]; Phinney, Alexi [Full Text]; Piroth, Werner [Abstract] [Full Text]; Pisano, Etta D. [Abstract] [Full Text]; Prasad, Shrinivas [Full Text]; Prokesch, Rupert W. [Abstract] [Full Text]; Provenzale, James M. [Full Text]
Q
R: Raherisson, C. [Abstract] [Full Text]; Rauch, Phillip L. [Full Text]; Remer, Erick M. [Abstract] [Full Text]; Rice, Thomas W. [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Rollins, Jenny [Abstract] [Full Text]; Rubesin, Stephen E. [Abstract] [Full Text]; Rubin, David A. [Abstract] [Full Text]; Ruehm, Stefan G. [Abstract] [Full Text]; Russell, Donald G. [Full Text]
S: Sadler, Michael A. [Full Text]; Sahani, Dushyant [Abstract] [Full Text]; Saini, Sanjay [Abstract] [Full Text]; Sam, Joseph W. [Abstract] [Full Text]; Schell, Michael [Abstract] [Full Text]; Schima, Wolfgang [Abstract] [Full Text]; Schmitz-Rode, Thomas [Abstract] [Full Text]; Schneider, Ernst [Abstract] [Full Text]; Schober, Ewald [Abstract] [Full Text]; Schwarz, Wolfram [Full Text]; Sferlazza, Steven J. [Abstract] [Full Text]; Sheafor, Douglas H. [Abstract] [Full Text]; Shibata, Toshiya [Full Text]; Shimahara, Yasuyuki [Full Text]; Siegel, Barry A. [Abstract] [Full Text]; Siegel, Stacey [Full Text]; Simon, U. [Abstract] [Full Text]; Slater, Gregory [Abstract] [Full Text]; Sondak, Vernon K. [Abstract] [Full Text]; Soo, Mary Scott [Full Text]; Sporn, Thomas A. [Full Text]; Suh, Su-Jhi [Abstract] [Full Text]; Sunshine, Jonathan H. [Abstract] [Full Text]
T: Takebayashi, S [Full Text]; Takeuchi, Yoshito [Abstract] [Full Text]; Talner, Lee B. [Full Text]; Tam, Paul K. H. [Abstract] [Full Text]; Tanaka, Ryoichi [Full Text]; Tani, Ichiro [Full Text]; Tello, Richard [Abstract] [Full Text]; Thomson, Ken R. [Abstract] [Full Text]; Tilanus-Linthorst, Madeleine M. A. [Abstract] [Full Text]; Toscano, A [Full Text]; Trojan, Joerg [Full Text]; Tsang, K. W. T. [Abstract] [Full Text]; Tubiana, Jean Michel [Abstract] [Full Text]; Tuerff, SD [Full Text]; Tung, Glenn A. [Abstract] [Full Text]; Tunick, Paul A. [Full Text]
U: Urban, Bruce A. [Full Text]
V: Valli, N. [Abstract] [Full Text]; Vaughn, David [Full Text]; Vychytil, Andreas [Abstract] [Full Text]
W: Waitches, Gayle M. [Full Text]; Wiggers, Theodore [Abstract] [Full Text]; Witte, David J. [Abstract] [Full Text]; Wong, Jimmie C. [Full Text]; Woo, Seung-Ku [Abstract] [Full Text]
X
Y: Yaghmai, Vahid [Full Text]; Yamamoto, Naritaka [Full Text]; Yamamoto, Toru [Full Text]; Yamaoka, Yoshio [Full Text]; Yasui, Kenzo [Abstract] [Full Text]
Z: Zeuzem, Stefan [Full Text]; Zimmerman, Jay B. [Abstract] [Full Text]