American Journal of Roentgenology Online -- Index by Author (1 December 2000, 175, Number 6)

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Index by Author: 1 December 2000; 175 (6) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z |

A: Abramson, Simeon [Abstract] [Full Text]; Ahn, Chang Ho [Full Text]; Aiello, Michael R. [Full Text]; An, Su Kyung [Full Text]; Andrews, Robert T. [Full Text]; Angeid-Backman, Elin [Abstract] [Full Text]; Applegate, Kimberly E. [Abstract] [Full Text]; Arakawa, Hiroaki [Full Text]; Arellano, Ronald S. [Full Text]; Argyropoulou, Maria I. [Abstract] [Full Text]; Armillotta, Nicola [Abstract] [Full Text]; Aronius, Ramon [Abstract] [Full Text]; Asada, Yasuyuki [Abstract] [Full Text]; Austin, John H. M. [Abstract] [Full Text]
B: Baijal, S. S. [Full Text]; Baron, Richard L. [Abstract] [Full Text]; Barr, Lori L. [Full Text]; Bartolozzi, Carlo [Abstract] [Full Text]; Battolla, Luigi [Abstract] [Full Text]; Berkmen, Yahya M. [Abstract] [Full Text]; Berlin, Leonard [Full Text]; Bitsis, Spiros [Abstract] [Full Text]; Biyani, Shekhar [Abstract] [Full Text]; Blane, Caroline E. [Abstract] [Full Text]; Bluemke, David A. [Abstract] [Full Text]; Boige, Valerie [Abstract] [Full Text]; Boland, Giles W. L. [Full Text]; Bonel, Harald M. [Abstract] [Full Text]; Boraschi, Piero [Abstract] [Full Text]; Boxt, Lawrence M. [Full Text]; Braccini, Giovanni [Abstract] [Full Text]; Brancaccio, William [Full Text]; Breen, David J. [Abstract] [Full Text]; Buck, David G. [Abstract] [Full Text]; Budorick, Nancy E. [Abstract] [Full Text]; Buetow, Michael P. [Full Text]
C: Cabrera, Julio [Full Text]; Callister, Tracy [Abstract] [Full Text]; Caramella, Davide [Abstract] [Full Text]; Carr, Brian I. [Abstract] [Full Text]; Casparie, J. W. B. M. [Full Text]; Cast, James E. I. [Abstract] [Full Text]; Chan, Yu-leung [Abstract] [Full Text]; Chang, David [Abstract] [Full Text]; Chang, Paul J. [Abstract] [Full Text]; Cheng, Jack Chun-yiu [Abstract] [Full Text]; Chik, Ki-Wai [Abstract] [Full Text]; Choi, Byung Ihn [Full Text]; Choi, Kyu H. [Full Text]; Choti, Michael A. [Abstract] [Full Text]; Chu, Winnie Chiu-wing [Abstract] [Full Text]; Chung, Jin Wook [Full Text]; Clavien, Pierre A. [Abstract] [Full Text]; Closset, Jean [Abstract] [Full Text]; Cooksey, Graeme [Abstract] [Full Text]; Corl, Frank M. [Abstract] [Full Text]; Costello, Joanna M. [Full Text]; Crotty, Eric J. [Abstract] [Full Text]; Cvitanic, Oliver [Full Text]
D: Dachman, Abraham H. [Full Text]; Darian, Vigen B. [Abstract] [Full Text]; de Baere, Thierry [Abstract] [Full Text]; de Lange, Eduard E. [Abstract] [Full Text]; DeSena, Salvatore [Abstract] [Full Text]; Desser, Terry S. [Abstract] [Full Text]; Din, Mostafa Gamal El [Abstract] [Full Text]; Donckier, Vincent [Abstract] [Full Text]; Donnelly, Lane F. [Abstract] [Full Text]; Donnelly, Lane F. [Full Text]; Dromain, Clarisse [Abstract] [Full Text]; Ducreux, Michel [Abstract] [Full Text]; Dupuy, Damian E. [Full Text]; Duwe, Kevin M. [Abstract] [Full Text]
E: Early, Alan S. [Abstract] [Full Text]; Efremidis, Stavros [Abstract] [Full Text]; Elias, Dominique [Abstract] [Full Text]; Erasmus, Jeremy J. [Full Text]; Erasmus, Jeremy J. [Abstract] [Full Text]; Esserman, Laura J. [Abstract] [Full Text]
F: Farmer, K. D. [Abstract] [Full Text]; Farrow, R. [Abstract] [Full Text]; Federle, Michael P. [Abstract] [Full Text]; Fessell, David P. [Full Text]; Fishman, Elliot K. [Abstract] [Full Text]; Fox, B. M. [Abstract] [Full Text]; Frei, Kathrin A. [Abstract] [Full Text]; Frisoli, Joan K. [Abstract] [Full Text]; Fujita, Takeshi [Abstract] [Full Text]; Fuksbrumer, Moshe S. [Abstract] [Full Text]; Funaki, Brian [Full Text]
G: Ganott, Marie [Abstract] [Full Text]; Gansbeke, Daniel Van [Abstract] [Full Text]; Garland, Melissa R. [Abstract] [Full Text]; Garofalo, Robert S. [Full Text]; Gendler, Robert [Full Text]; Gentile, Liz [Full Text]; Gigoni, Roberto [Abstract] [Full Text]; Gilkeson, Robert C. [Abstract] [Full Text]; Ginsberg, Gregory G. [Abstract] [Full Text]; Giovagnorio, Francesco [Full Text]; Gluck, Brad S. [Full Text]; Good, Walter F. [Abstract] [Full Text]; Graham, Roger A. [Abstract] [Full Text]; Gupta, Sanjay [Abstract] [Full Text]
H: Ha, Hyun Kwon [Full Text]; Habra, Ghiyath [Abstract] [Full Text]; Han, Joon Koo [Full Text]; Hardesty, Lara [Abstract] [Full Text]; Harries, S. R. [Abstract] [Full Text]; Harris, Alison C. [Full Text]; Hasso, Anton N. [Full Text]; Hayashi, Kuniaki [Abstract] [Full Text]; Hayes, Curtis W. [Full Text]; Hijazi, Ziyad M. [Full Text]; Ho, Stephen G. F. [Full Text]; Holbert, Brenda [Abstract] [Full Text]; Homer, Marc J. [Abstract] [Full Text]; Hylton, Nola M. [Abstract] [Full Text]
I: Iannitti, David A. [Full Text]; Iida, Yoshiro [Abstract] [Full Text]; Itai, Yuji [Abstract] [Full Text]; Ito, Katsuyoshi [Abstract] [Full Text]
J: Jacobson, Jon A. [Full Text]; Jacobson, Jon A. [Abstract] [Full Text]; Jain, Rajan [Full Text]; Jankulov, Vladislav [Full Text]; Janowitz, Warren [Abstract] [Full Text]; Jeffrey, R. Brooke [Abstract] [Full Text]; Johns, Christopher M. [Abstract] [Full Text]
K: Karmy-Jones, Riyad [Full Text]; Kasahara, Yoshio [Abstract] [Full Text]; Katyal, Sanjeev [Abstract] [Full Text]; Katyal, Sanjeev [Abstract] [Full Text]; Katz, Judith F. [Abstract] [Full Text]; Kifune, Koichi [Abstract] [Full Text]; Kim, Hyun Beom [Full Text]; Kim, Ki Jun [Full Text]; Kim, Kyoung Mee [Full Text]; Kim, Tae Kyoung [Full Text]; Kinkel, Karen [Abstract] [Full Text]; Kiortsis, Dimitrios N. [Abstract] [Full Text]; Kitagawa, Kiyohide [Abstract] [Full Text]; Klimstra, David [Abstract] [Full Text]; Klym, Amy H. [Abstract] [Full Text]; Koike, Shinji [Abstract] [Full Text]; Kuoch, Viseth [Abstract] [Full Text]; Kurihara, Yasuyuki [Full Text]
L: Lassau, Nathalie [Abstract] [Full Text]; Lasser, Philippe [Abstract] [Full Text]; Laufer, Igor [Abstract] [Full Text]; Lee, Jae-Hee [Full Text]; Lee, Sung Yong [Full Text]; Levine, Marc S. [Abstract] [Full Text]; Li, Chi-kong [Abstract] [Full Text]; Lin, John [Full Text]; Lipton, Martin J. [Full Text]; Lockhart, Mark [Full Text]; Louwerens, Jan Willem K. [Abstract] [Full Text]; Low, Vincent H. S. [Full Text]; Lu, Ying [Abstract] [Full Text]; Lyburn, Iain D. [Full Text]
M: Makuuchi, Hiroyasu [Full Text]; Marshall, Kelley W. [Abstract] [Full Text]; Marteau, Veronique [Abstract] [Full Text]; Maskell, G. F. [Abstract] [Full Text]; Matsui, Osamu [Abstract] [Full Text]; Matsunaga, Naofumi [Abstract] [Full Text]; Mayo-Smith, William W. [Full Text]; McAdams, H. Page [Abstract] [Full Text]; Metafratzi, Zafiroula [Abstract] [Full Text]; Miketic-Fielding, Linda M. [Full Text]; Miller, Donald L. [Full Text]; Miller, Jeffrey [Full Text]; Miura, Shoji [Abstract] [Full Text]; Miyayama, Shiro [Abstract] [Full Text]; Moll, F. L. [Full Text]; Mori, Harushi [Abstract] [Full Text]; Mori, Kensaku [Abstract] [Full Text]; Moritz, Jörg D. [Full Text]; Mueller, Peter R. [Full Text]; Munk, Peter L. [Full Text]; Myer, Charles M. III [Abstract] [Full Text]
N: Nakajima, Yasuo [Full Text]; Nelson, William M. [Abstract] [Full Text]; Neri, Emanuele [Abstract] [Full Text]; Niimi, Hiroshi [Full Text]; Nolthenius, R. P. Tutein [Full Text]
O: O'Donnell, Judith [Abstract] [Full Text]; Ohtaki, Makoto [Full Text]; Okamoto, Yoshikazu [Abstract] [Full Text]; Okazaki, Hajime [Abstract] [Full Text]; Oliver, James H. [Abstract] [Full Text]; Oliver, James H. III [Abstract] [Full Text]
P: Pandey, C. K. [Full Text]; Pang, Lai-man [Abstract] [Full Text]; Panicek, David M. [Abstract] [Full Text]; Park, Jae Hyung [Full Text]; Park, Young Sup [Full Text]; Patten, Randall M. [Full Text]; Paulino, Augusto F. G. [Abstract] [Full Text]; Paulson, Erik K. [Abstract] [Full Text]; Peterson, Mark S. [Abstract] [Full Text]; Phadke, R. V. [Full Text]; Propeck, Tim [Abstract] [Full Text]
Q: Quinn, Timothy J. [Abstract] [Full Text]
R: Raggi, Paolo [Abstract] [Full Text]; Ricca, Richard [Full Text]; Robbin, Mark R. [Abstract] [Full Text]; Roche, Alain [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Roggli, Victor L. [Abstract] [Full Text]; Rothschild, Janice G. [Abstract] [Full Text]; Rubesin, Stephen E. [Abstract] [Full Text]; Rubin, David A. [Full Text]
S: Sadahiro, Sotaro [Full Text]; Saenger, Eugene L. [Full Text]; Saida, Yukihisa [Abstract] [Full Text]; Sakamoto, Ichiro [Abstract] [Full Text]; Saraswat, V. A. [Full Text]; Schietzel, Michael [Abstract] [Full Text]; Shah, Rosita M. [Abstract] [Full Text]; Shiau, Maria [Abstract] [Full Text]; Sijbrandij, Elisabeth S. [Abstract] [Full Text]; Sporn, Thomas A. [Abstract] [Full Text]; Strauss, Barry [Full Text]; Strife, Janet L. [Abstract] [Full Text]; Stuhrmann, Markus [Abstract] [Full Text]; Sueyoshi, Eijun [Abstract] [Full Text]; Sumkin, Jules H. [Abstract] [Full Text]; Suzuki, Toshiyuki [Full Text]; Sy, Marième [Abstract] [Full Text]
T: Tajima, Tomoo [Full Text]; Takahashi, Nobuyuki [Abstract] [Full Text]; Takano, Katsuyuki [Abstract] [Full Text]; Tamsen, Ali [Full Text]; Teitelbaum, Daniel H. [Abstract] [Full Text]; Tokunaga, Nobuhiro [Full Text]; Torreggiani, William C. [Full Text]; Tsatsoulis, Agathocles [Abstract] [Full Text]; Turner, David A. [Full Text]
U
V: van den Berg, J. C. [Full Text]; van Gils, Ad P. G. [Abstract] [Full Text]; van Leeuwen, Kathy [Abstract] [Full Text]
W: Waitches, Gayle M. [Full Text]; Walders, Natalie [Abstract] [Full Text]; Warnock, Niall G. [Abstract] [Full Text]; Weadock, William J. [Full Text]; Webb, W. Richard [Full Text]
X
Y: Yamamoto, Toru [Abstract] [Full Text]; Yamashiro, Masashi [Abstract] [Full Text]; Yoshioka, Hiroshi [Abstract] [Full Text]; Yu, Eunsil [Full Text]; Yutan, Elaine [Full Text]
Z: Zalcman, Marc [Abstract] [Full Text]; Zaleski, George X. [Full Text]; Zwirewich, Charles V. [Full Text]