American Journal of Roentgenology Online -- Index by Author (1 June 2001, 176, Number 6)

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Index by Author: 1 June 2001; 176 (6) [Table of Contents]

| A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z |

A: Abramson, Neil [Abstract] [Full Text]; Abramson, Simeon [Abstract] [Full Text]; Ahdoot, David [Abstract] [Full Text]; Akpek, Sergin [Full Text]; Alexander, Cindy [Abstract] [Full Text]; Ametani, Fumie [Abstract] [Full Text]; Artinian, Mihran [Full Text]; Au, W. Y. [Abstract] [Full Text]
B: Babikian, Viken [Full Text]; Baek, Seung Yon [Abstract] [Full Text]; Baker, Kim B. [Full Text]; Baker, Mark E. [Full Text]; Barré, Olivier [Abstract] [Full Text]; Bassignani, Matthew J. [Abstract] [Full Text]; Berbaum, Kevin S. [Abstract] [Full Text]; Berdon, Walter [Abstract] [Full Text]; Berlin, Leonard [Full Text]; Berman, Phil M. [Abstract] [Full Text]; Bickmore, Dan [Abstract] [Full Text]; Bisset, George S. III [Full Text]; Blankstein, Elissa [Abstract] [Full Text]; Boechat, M. Ines [Abstract] [Full Text]; Bomyea, Karen [Abstract] [Full Text]; Boyko, Orest B. [Full Text]; Bruckert, Frédéric [Abstract] [Full Text]; Brunereau, Laurent [Full Text]; Buckley, Rebecca H. [Full Text]
C: Carr, James C. [Full Text]; Chaiwun, Benjaporn [Full Text]; Chao, Steven [Full Text]; Chim, C. S. [Abstract] [Full Text]; Cho, Jeong Yeon [Abstract] [Full Text]; Cleveland, Robert [Abstract] [Full Text]; Cochran, Sachiko T. [Abstract] [Full Text]
D: DeLong, David M. [Abstract] [Full Text]; DeLong, David M. [Abstract] [Full Text]; Deutsch, Larry S. [Abstract] [Full Text]; Diflo, Thomas [Abstract] [Full Text]; DiPiro, Pamela J. [Full Text]; Doerfler, Otto [Abstract] [Full Text]; Donnelly, Lane F. [Full Text]; Donnelly, Lane F. [Full Text]; Donnelly, Lane F. [Full Text]; Drotman, Michele B. [Abstract] [Full Text]; Drugay, Joseph J. [Full Text]; Dubourg, Olivier [Abstract] [Full Text]
E: Eisenberg, Rosana [Abstract] [Full Text]; El Hajjam, Mostafa [Abstract] [Full Text]; Eschelman, David J. [Full Text]
F: Freed, Kelly S. [Abstract] [Full Text]; Friedman, David P. [Full Text]; Frush, Donald P. [Full Text]; Frush, Donald P. [Full Text]; Fujii, Shingo [Abstract] [Full Text]; Fulcher, Ann S. [Abstract] [Full Text]; Funaki, Brian [Abstract] [Full Text]
G: Gabelmann, Andreas [Abstract] [Full Text]; Gendler, Robert [Full Text]; Gessner, Angela J. [Full Text]; Gevenois, Pierre Alain [Full Text]; Gibney, Robin [Full Text]; Gilkeson, Robert C. [Abstract] [Full Text]; Goldman, H. Warren [Full Text]; Goldstein, Jeffrey D. [Abstract] [Full Text]; Gore, Richard M. [Full Text]; Gorich, Johannes [Abstract] [Full Text]; Gourtsoyiannis, Nicholas [Full Text]; Graham, Ruffin J. [Full Text]; Grenier, Nicolas [Full Text]; Griffin, James [Full Text]; Groell, Reinhard [Abstract] [Full Text]; Guenin, Mark A. [Full Text]; Gunderman, Richard B. [Full Text]
H: Habermann, Walter [Abstract] [Full Text]; Hachiya, Junichi [Abstract] [Full Text]; Hall, Ferris M. [Full Text]; Han, Daehee [Abstract] [Full Text]; Hanly, Sinead [Full Text]; Hasegawa, Minoru [Abstract] [Full Text]; Henley, Bradford M. [Full Text]; Herbreteau, Denis [Full Text]; Heshiki, Atsuko [Full Text]; Hess, Kenneth R. [Abstract] [Full Text]; Higuchi, Toshihiro [Abstract] [Full Text]; Holemans, John A. [Full Text]; Honda, Takayuki [Abstract] [Full Text]
I: Ishimori, Takayoshi [Abstract] [Full Text]; Ishiyama, Tetsuya [Abstract] [Full Text]; Itoh, Kyo [Abstract] [Full Text]
J: John, Devon [Abstract] [Full Text]; Jones, Paul H. [Abstract] [Full Text]; Joseph, Thierry [Abstract] [Full Text]
K: Kanamalla, Uday S. [Full Text]; Karlik, Stephen J. [Full Text]; Karmazin, Boaz [Full Text]; Katase, Shichiro [Abstract] [Full Text]; Kattan, Meyer [Abstract] [Full Text]; Kawakami, Satoshi [Abstract] [Full Text]; Kawakami, Satoshi [Abstract] [Full Text]; Kawamoto, Satomi [Full Text]; Keogan, Mary T. [Abstract] [Full Text]; Khong, P. L. [Abstract] [Full Text]; Kidney, David D. [Full Text]; Kidney, David D. [Abstract] [Full Text]; Kim, Seung Hyup [Abstract] [Full Text]; Kliewer, Mark A. [Abstract] [Full Text]; Koenigsberg, Tova [Abstract] [Full Text]; Konishi, Junji [Abstract] [Full Text]; Konishi, Junji [Abstract] [Full Text]; Kory, Leslie A. [Full Text]; Kottal, Roy A. [Full Text]; Kramer, Stefan [Abstract] [Full Text]; Krinsky, Glenn A. [Abstract] [Full Text]; Kugler, Christian [Abstract] [Full Text]; Kwong, Y. L. [Abstract] [Full Text]
L: Lacombe, Pascal [Abstract] [Full Text]; Lamki, Lamk [Full Text]; Lavelle, Michael T. [Abstract] [Full Text]; Leder, Richard A. [Abstract] [Full Text]; Lee, Han J. [Abstract] [Full Text]; Lee, Jae Young [Abstract] [Full Text]; Lee, Vivian S. [Abstract] [Full Text]; Leef, Jeff [Abstract] [Full Text]; Lester, Susan C. [Full Text]; Levin, David C. [Full Text]; Li, Feng [Abstract] [Full Text]; Lie, A. K. W. [Abstract] [Full Text]; Liem, S. J. [Full Text]; Linnau, Ken F. [Full Text]; Livne, Pinhas M. [Full Text]; Lojanapiwat, Bannakit [Full Text]
M: Machnicki, Stephen C. [Abstract] [Full Text]; Maetani, Yoji [Abstract] [Full Text]; Magaram, David [Full Text]; Majors, Carol [Abstract] [Full Text]; Mamede, Marcelo [Abstract] [Full Text]; Mandai, Masaki [Abstract] [Full Text]; Marcos, Amadeo [Abstract] [Full Text]; Martin, Leo F. W. [Full Text]; Maruyama, Yuichiro [Abstract] [Full Text]; Matsumoto, Hiroshi [Full Text]; Matsushita, Tsuyoshi [Abstract] [Full Text]; Mayr, Nina A. [Abstract] [Full Text]; McCarville, M. Beth [Full Text]; McCulloch, Patrick [Full Text]; Mellins, Robert B. [Abstract] [Full Text]; Mercado, Cecilia [Abstract] [Full Text]; Mesurolle, Benoit [Abstract] [Full Text]; Meyer, Jack E. [Full Text]; Meziane, Moulay [Abstract] [Full Text]; Momose, Mitsuhiro [Abstract] [Full Text]; Morales, Robert E. [Full Text]; Morgan, Glyn R. [Abstract] [Full Text]; Morrison, William B. [Full Text]; Mullins, Mark E. [Full Text]; Munden, Reginald F. [Abstract] [Full Text]; Muttarak, Malai [Full Text]
N: Nakamoto, Yuji [Abstract] [Full Text]; Nelson, Rendon C. [Abstract] [Full Text]; Nguyen, Alison M. [Abstract] [Full Text]; Nollevaux, Marie-Cécile [Full Text]; Norton, Karen I. [Abstract] [Full Text]
O: O'Donovan, Peter B. [Full Text]; Obuchowski, Nancy A. [Full Text]; Oliva, Vincent L. [Abstract] [Full Text]; Ooi, G. C. [Abstract] [Full Text]
P: Pandharipande, Pari V. [Abstract] [Full Text]; Panicek, David M. [Abstract] [Full Text]; Papanikolaou, Nicholas [Full Text]; Pappo, Alberto S. [Full Text]; Pariente, Jean-Louis [Full Text]; Parsons, Theodore W. [Full Text]; Peh, Wilfred C. G. [Full Text]; Penrod, Brian J. [Full Text]; Pile-Spellman, Eliza [Abstract] [Full Text]; Platzker, Arnold C. G. [Abstract] [Full Text]; Powell, Kimerly A. [Full Text]; Prassopoulos, Panos [Full Text]
Q: Qanadli, Salah D. [Abstract] [Full Text]
R: Rabie, Abdelhack [Full Text]; Rao, J. Sunil [Abstract] [Full Text]; Raptopoulos, Vassilios [Full Text]; Rezai, Karim [Abstract] [Full Text]; Rofsky, Neil M. [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Rogers, Lee F. [Full Text]; Rosenblum, Jordan [Abstract] [Full Text]; Rosenthal, Stanton J. [Abstract] [Full Text]; Rouleau, Philippe [Full Text]; Ruppert, Georg S. [Abstract] [Full Text]; Ruppert-Kohlmayr, Andrea J. [Abstract] [Full Text]
S: Saga, Tsuneo [Abstract] [Full Text]; Saito, Akitoshi [Abstract] [Full Text]; Sakahara, Harumi [Abstract] [Full Text]; Salazar, Ana M. [Full Text]; Sanders, Timothy G. [Full Text]; Sato, Katsuhiko [Full Text]; Sayre, James W. [Abstract] [Full Text]; Schaffler, Gottfried [Abstract] [Full Text]; Schaffler, Gottfried J. [Abstract] [Full Text]; Schatzki, Stefan C. [Full Text]; Schlossberg, Peter [Abstract] [Full Text]; Schwartz, Lawrence H. [Abstract] [Full Text]; Shah, Rosita M. [Full Text]; Sheafor, Douglas H. [Abstract] [Full Text]; Shibata, Toshiya [Abstract] [Full Text]; Simonson, Teresa M. [Abstract] [Full Text]; Singer, Cory [Abstract] [Full Text]; Slanetz, Priscilla J. [Full Text]; Smith, John J. [Full Text]; Smith, Suzanne J. [Abstract] [Full Text]; Sone, Shusuke [Abstract] [Full Text]; Spirn, Paul W. [Full Text]; Spunt, Sheri L. [Full Text]; Steiner, Robert M. [Full Text]; Sullivan, Kevin L. [Full Text]; Szucs, Richard A. [Abstract] [Full Text]
T: Tack, Denis [Full Text]; Takashima, Shodayu [Abstract] [Full Text]; Takashima, Shodayu [Abstract] [Full Text]; Takayama, Fumiyoshi [Abstract] [Full Text]; Tanaka, Junji [Full Text]; Taoka, Toshiaki [Abstract] [Full Text]; Teperman, Lewis W. [Abstract] [Full Text]; Theoharis, Jennifer [Abstract] [Full Text]; Togashi, Kaori [Abstract] [Full Text]; Togo, Yoshichika [Full Text]; Trautwein, Lynn [Abstract] [Full Text]; Trillaud, Hervé [Full Text]; Tritou, Ioanna [Full Text]; Tsang, K. W. T. [Abstract] [Full Text]; Tsuchiya, Kazuhiro [Abstract] [Full Text]
U: Ueda, Yoshihiko [Full Text]; Uggowitzer, Martin M. [Abstract] [Full Text]
V: Vieillard-Baron, Antoine [Abstract] [Full Text]
W: Wang, Jichen [Abstract] [Full Text]; Watanabe, Chihiro [Abstract] [Full Text]; Wechsler, Richard J. [Full Text]; Weinreb, Jeffrey C. [Abstract] [Full Text]; Westenend, Pieter J. [Full Text]; Wetzel, Louis H. [Abstract] [Full Text]; Winston, Corinne B. [Abstract] [Full Text]; Wood, Beverly [Abstract] [Full Text]; Woodard, Pamela K. [Abstract] [Full Text]; Wottrich, Scott [Full Text]; Wottrich, Scott [Full Text]
X
Y: Yamabe, Hirohiko [Abstract] [Full Text]; Yang, Zhi-Gang [Abstract] [Full Text]; Yoo, Hyok-Hee [Abstract] [Full Text]; Yoshino, Ayako [Abstract] [Full Text]; Yossepowitch, Ofer [Full Text]; Yousem, David M. [Full Text]; Yuh, William T. C. [Abstract] [Full Text]
Z: Zaleski, George X. [Abstract] [Full Text]; Zebedin, Doris [Abstract] [Full Text]; Zi Yin, Emma [Full Text]