AJR -- Index by Author (Jan 2002; Volume 178, Number 1)

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Index by Author: 1 January 2002; 178 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abu-Judeh, Hani H. [Full Text]; Allen, Nancy B. [Abstract] [Full Text]; Allgayer, Bernhard [Full Text]; Apter, S. [Abstract] [Full Text]; Avni, Fred E. [Abstract] [Full Text]
B: Baj, Mahesh [Full Text]; Barrie, J. R. [Abstract] [Full Text]; Behar, Jeffrey V. [Abstract] [Full Text]; Ben-Yehuda, D. [Abstract] [Full Text]; Berk, Robert N. [Full Text]; Berlin, Leonard [Full Text]; Bessoud, B. [Abstract] [Full Text]; Boger-Megiddo, I. [Abstract] [Full Text]; Boige, V. [Abstract] [Full Text]; Boroja, M. [Abstract] [Full Text]; Bost, Frederic W. [Abstract] [Full Text]; Bredella, Miriam A. [Abstract] [Full Text]; Bremer, Christoph [Abstract] [Full Text]; Bureau, Christophe [Abstract] [Full Text]
C: Cengiz, Huelya [Abstract] [Full Text]; Cha, Soonmee [Full Text]; Chabbert, Valérie [Abstract] [Full Text]; Champlin, Anna M. [Abstract] [Full Text]; Chemla, Patricia [Abstract] [Full Text]; Chen, Pao-Huei [Abstract] [Full Text]; Chen, Ran-Chou [Abstract] [Full Text]; Chen, Wei-Tsung [Abstract] [Full Text]; Cheng, Nai-Yuan [Abstract] [Full Text]; Choi, Yo-Won [Abstract] [Full Text]; Chou, Chung Kuao [Full Text]; Coakley, Fergus V. [Abstract] [Full Text]; Cohen, Wendy A. [Full Text]; Coll, Deirdre M. [Abstract] [Full Text]; Cooper, Richard A. [Full Text]; Cosar, Ediz [Full Text]; Czarnecki, Lawrence A. [Full Text]; Czermak, Benedikt V. [Full Text]
D: Da Pian, Pierpaolo [Abstract] [Full Text]; de Baere, T. [Abstract] [Full Text]; de Valois, J. C. [Abstract] [Full Text]; Delaet, Marc-Henri [Abstract] [Full Text]; Demos, Terrence C. [Full Text]; Dromain, C. [Abstract] [Full Text]; Ducreux, M. [Abstract] [Full Text]; Dwyer, Andrew J. [Abstract] [Full Text]
E: Ebert, Wolfgang [Abstract] [Full Text]; Eisele, Jeffrey [Abstract] [Full Text]; Eisenstat, Recha S. [Abstract] [Full Text]; Eisenstat, Recha S. [Full Text]; Elias, D. [Abstract] [Full Text]
F: Falk, Abigail [Full Text]; Falk, Abigail [Full Text]; Federle, Michael P. [Abstract] [Full Text]; Feuerbach, Stefan [Abstract] [Full Text]; Finn, J. Paul [Abstract] [Full Text]; Fishman, Elliot K. [Full Text]; Fründ, Rüdiger [Abstract] [Full Text]
G: Geens, Viviane [Abstract] [Full Text]; Genant, Harry K. [Abstract] [Full Text]; George, Ajax E. [Full Text]; Gerber, Lynn H. [Abstract] [Full Text]; Girish, B. V. [Abstract] [Full Text]; Gooding, Charles A. [Abstract] [Full Text]; Grant, Edward G. [Abstract] [Full Text]; Grist, Thomas M. [Abstract] [Full Text]; Groell, Reinhard [Full Text]; Guibaud, Laurent [Abstract] [Full Text]; Gurney, Jud W. [Abstract] [Full Text]
H: Habermann, Walter [Full Text]; Hackstein, Nils [Abstract] [Full Text]; Hahn, Peter F. [Full Text]; Hall, Ferris M. [Full Text]; Hamer, Okka [Abstract] [Full Text]; Harrison, Michael R. [Abstract] [Full Text]; Hartman, Thomas A. [Abstract] [Full Text]; Heindel, Walter [Abstract] [Full Text]; Hendrick, R. Edward [Full Text]; Henseler, Kevin P. [Abstract] [Full Text]; Hohenwalter, Mark D. [Full Text]; Hruban, Ralph [Full Text]
J: Jadvar, Hossein [Full Text]; Jadvar, Hossein [Full Text]; Jeanes, Annmarie [Full Text]; Jeffrey, R. Brooke, Jr. [Abstract] [Full Text]; Joffre, Francis [Abstract] [Full Text]; Johnson, Diane [Abstract] [Full Text]
K: Kaiser, Larry R. [Full Text]; Kammen, Bamidele F. [Abstract] [Full Text]; Kane, Robert A. [Abstract] [Full Text]; Karantanas, Apostolos [Full Text]; Katsumori, Tetsuya [Abstract] [Full Text]; Katz, Douglas S. [Abstract] [Full Text]; Katz, Douglas S. [Full Text]; Kelsey, Charles A. [Abstract] [Full Text]; Kennedy, Bernadette [Abstract] [Full Text]; Kenney, Philip J. [Full Text]; Khadivi, Yeganeh [Abstract] [Full Text]; Khosla, Anil [Full Text]; Kim, Connie [Abstract] [Full Text]; King, Jerry N. [Abstract] [Full Text]; Kingston, Catherine A. [Full Text]; Kotloff, Robert [Full Text]; Kraut, Michael A. [Full Text]
L: Laifer-Narin, Sherelle [Abstract] [Full Text]; Lane, Michael J. [Abstract] [Full Text]; Lane, Michael J. [Abstract] [Full Text]; Lassau, N. [Abstract] [Full Text]; Lassman, Charles [Abstract] [Full Text]; Lawler, Leo P. [Full Text]; Layer, Günter [Abstract] [Full Text]; Ledermann, Hans Peter [Abstract] [Full Text]; Lesniak, Robert J. [Full Text]; Levine, Deborah [Abstract] [Full Text]; Li, Debiao [Abstract] [Full Text]; Liao, Li-Ying [Abstract] [Full Text]; Libson, E. [Abstract] [Full Text]; Lin, Rudolph Y. [Abstract] [Full Text]; Linnau, Ken F. [Full Text]; Lu, David S. K. [Abstract] [Full Text]
M: Maciolek, Lawrence J. [Abstract] [Full Text]; Maldjian, Joseph A. [Full Text]; Malone, Marian [Full Text]; Martinez-Noguera, Antonio [Full Text]; Matzkies, Fritz [Abstract] [Full Text]; McAdams, H. Page [Abstract] [Full Text]; McCarthy, Denis M. [Full Text]; Mehta, Tejas S. [Abstract] [Full Text]; Melhem, Elias R. [Full Text]; Metens, Thierry [Abstract] [Full Text]; Mihara, Tadashi [Abstract] [Full Text]; Mirvis, Stuart E. [Abstract] [Full Text]; Mirvis, Stuart E. [Full Text]; Moll, F. L. [Abstract] [Full Text]; Monsky, Wayne L. [Abstract] [Full Text]; Mori, Susumu [Full Text]; Morrison, William B. [Abstract] [Full Text]; Mukundan, Govind [Full Text]
N: Nakajima, Kazuhiro [Abstract] [Full Text]; Nemcek, Albert A., Jr. [Abstract] [Full Text]; Nisenbaum, Harvey [Abstract] [Full Text]; Nof, E. [Abstract] [Full Text]
O: Omary, Reed A. [Abstract] [Full Text]; Otal, Philippe [Abstract] [Full Text]; Overtoom, T. Th. C. [Abstract] [Full Text]; Owens, Catherine M. [Full Text]
P: Pacharn, Preeyacha [Abstract] [Full Text]; Palmer, Jaume [Full Text]; Panicek, David M. [Abstract] [Full Text]; Parmenter, Evelyn K. [Abstract] [Full Text]; Peron, Jean Marc [Abstract] [Full Text]; Perry, Monique B. [Abstract] [Full Text]; Pezzullo, John A. [Full Text]; Pochaczevsky, Rubem [Full Text]; Pomper, Martin G. [Full Text]; Prabhakar, Priya [Abstract] [Full Text]; Premkumar, Ahalya [Abstract] [Full Text]; Price, Donald B. [Full Text]
R: Ragavendra, Nagesh [Abstract] [Full Text]; Ralls, Philip W. [Abstract] [Full Text]; Raman, Steven S. [Abstract] [Full Text]; Rau, Wigbert S. [Abstract] [Full Text]; Ray, Charles E. [Full Text]; Raymond, G. S. [Abstract] [Full Text]; Reddy, Denise [Full Text]; Reimer, Peter [Abstract] [Full Text]; Robert, Yann [Abstract] [Full Text]; Roche, A. [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Rosenthal, Alan D. [Full Text]; Rousseau, Hervé [Abstract] [Full Text]; Rubaltelli, Leopoldo [Abstract] [Full Text]; Rubenstein, Joel [Full Text]
S: Sabaté, Josep M. [Full Text]; Sakellariou, Evagelos [Full Text]; Salomon, Caryl [Full Text]; Sauerbruch, Tilman [Abstract] [Full Text]; Savastano, Sergio [Abstract] [Full Text]; Sayre, James [Abstract] [Full Text]; Schaefer, Roland M. [Abstract] [Full Text]; Schiedermaier, Peter [Abstract] [Full Text]; Schuss, Allan L. [Full Text]; Schwartz, Lawrence H. [Abstract] [Full Text]; Schweitzer, Mark E. [Abstract] [Full Text]; Segers, Valérie [Abstract] [Full Text]; Shanmuganathan, K. [Full Text]; Shawker, Thomas H. [Abstract] [Full Text]; Siegelman, Evan S. [Full Text]; Singer, Cory [Full Text]; Smayra, T. [Abstract] [Full Text]; Smayra, Tarek [Abstract] [Full Text]; Smith, Robert C. [Abstract] [Full Text]; Soma, Lorinda A. [Full Text]; Spencer, J. A. [Abstract] [Full Text]; Stark, Paul [Full Text]; Stoller, David W. [Abstract] [Full Text]; Stramare, Roberto [Abstract] [Full Text]; Strobel, Klaus [Full Text]; Strotzer, Michael [Abstract] [Full Text]
T: Taylor, Andrew J. [Full Text]; Taylor, George A. [Full Text]; Tirman, Phillip F. J. [Abstract] [Full Text]; Tokuhiro, Mitsukuni [Abstract] [Full Text]; Tomaszewski, John E. [Full Text]; Tombach, Bernd [Abstract] [Full Text]; Torigian, Drew A. [Full Text]; Torrubia, Sofía [Full Text]; Toye, Leon R. [Full Text]; Tregnaghi, Alberto [Abstract] [Full Text]; Treumann, Thomas C. [Full Text]; Tripp, David A. [Abstract] [Full Text]; Tu, Hsing-Yang [Abstract] [Full Text]
U: Unal, Orhan [Abstract] [Full Text]
V: van den Berg, J. C. [Abstract] [Full Text]; van Zijl, Peter C. M. [Full Text]; Varanelli, Michael J. [Abstract] [Full Text]; Velesiotou, Konstantina [Full Text]; Venta, Luz A. [Full Text]; Venzon, David [Abstract] [Full Text]; Vinel, Jean Pierre [Abstract] [Full Text]; Vodopich, Darko J. [Abstract] [Full Text]; Vogelzang, Robert L. [Abstract] [Full Text]; Völk, Markus [Abstract] [Full Text]
W: Wallach, Michael T. [Full Text]; Wang, Chaur-Shine [Abstract] [Full Text]; Wang, Chung-Kwe [Abstract] [Full Text]; Wang, Michael [Abstract] [Full Text]; Weekes, Arnold [Abstract] [Full Text]; Whitford, Allen C. [Abstract] [Full Text]; Wiltgen, Marco [Full Text]; Wippold, Franz J., II [Full Text]; Wischer, Thorsten K. [Abstract] [Full Text]; Wolf, Gerald [Full Text]
Y: Yao, Dorcas C. [Abstract] [Full Text]
Z: Zalis, Michael E. [Full Text]; Ziereisen, France [Abstract] [Full Text]; Ziv, Amitai [Abstract] [Full Text]; Zorger, Niels [Abstract] [Full Text]