AJR -- Index by Author (Dec 2002; Volume 179, Number 6)

HOME

HELP

FEEDBACK

SUBSCRIPTIONS

ARCHIVE

TABLE OF CONTENTS

QUICK SEARCH:

[advanced]

	Author:		Keyword(s):
Year:		Vol:		Page:

Index by Author: 1 December 2002; 179 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbas, Maher A. [Abstract] [Full Text]; Abbasciano, Vincenzo [Full Text]; Abdulla, Cedela [Abstract] [Full Text]; Ahmad, Aamir [Abstract] [Full Text]; Antoch, Gerald [Abstract] [Full Text]; Aranha, Gerard [Full Text]; Arger, Peter H. [Abstract] [Full Text]; Arrivé, L. [Full Text]
B: Ba-Ssalamah, Ahmed [Abstract] [Full Text]; Baker, Stephen R. [Full Text]; Barentsz, Jelle O. [Abstract] [Full Text]; Barillani, Melissa [Full Text]; Barkhausen, Jörg [Abstract] [Full Text]; Bassett, Lawrence W. [Abstract] [Full Text]; Bastani, Roshan [Abstract] [Full Text]; Bender, Thomas [Abstract] [Full Text]; Berlin, Leonard [Full Text]; Bettmann, Michael A. [Abstract] [Full Text]; Bhalla, Sanjeev [Full Text]; Blachar, Arye [Full Text]; Bloem, Johan L. [Full Text]; Bockisch, Andreas [Abstract] [Full Text]; Bogaert, Jan [Full Text]; Boland, Giles W. [Abstract] [Full Text]; Bonomo, Lorenzo [Abstract] [Full Text]; Brenner, R. James [Full Text]; Britton, Cynthia A. [Abstract] [Full Text]; Brown, Jeffrey J. [Full Text]; Brown, Manuel L. [Abstract] [Full Text]; Brown, Martin L. [Abstract] [Full Text]; Bui-Mansfield, Liem T. [Full Text]
C: Ceccotti, Piercarlo [Full Text]; Chang, Thomas S. [Abstract] [Full Text]; Charles, Hearns W. [Abstract] [Full Text]; Collins, Joseph M. [Abstract] [Full Text]; Comeau, Cindy R. [Full Text]; Coumbaras, M. [Full Text]
D: d'Othee, B. Janne [Abstract] [Full Text]; Dahan, H. [Full Text]; Daprà, Massimo [Abstract] [Full Text]; Davis, William W. [Abstract] [Full Text]; Debatin, Joerg F. [Abstract] [Full Text]; Debatin, Jörg F. [Abstract] [Full Text]; Debatin, Jörg F. [Abstract] [Full Text]; Degani, Hadassa [Abstract] [Full Text]; Del Maschio, Alessandro [Abstract] [Full Text]; Demos, Terrence C. [Full Text]; Dershaw, D. David [Full Text]; Dogra, Vikram [Full Text]; Donnelly, Lane F. [Abstract] [Full Text]; Dymarkowski, Steven [Full Text]
E: Eggebrecht, Holger [Abstract] [Full Text]; Ehara, Shigeru [Full Text]; Elsayes, Khaled M. [Full Text]; Emby, D. J. [Full Text]; Erbel, Raimund [Abstract] [Full Text]
F: Fallenberg, Eva Maria [Abstract] [Full Text]; Federle, Michael P. [Full Text]; Fischbach, Roman [Abstract] [Full Text]; Fishman, Elliot K. [Full Text]; Fon, Gerald T. [Abstract] [Full Text]; Freudenberg, Lutz S. [Abstract] [Full Text]; Fuhrman, Carl R. [Abstract] [Full Text]; Furman-Haran, Edna [Abstract] [Full Text]
G: Gaßner, Ingmar [Abstract] [Full Text]; Geley, Theresa [Abstract] [Full Text]; Gemery, John M. [Abstract] [Full Text]; Gervais, Debra A. [Abstract] [Full Text]; Giorgi, Benedetta [Full Text]; Giustra, Peter E. [Full Text]; Glockner, James [Full Text]; Gnant, Michael [Abstract] [Full Text]; Goo, Hyun Woo [Full Text]; Gottlieb, Ronald H. [Full Text]; Grabbe, Eckhardt [Abstract] [Full Text]; Gratz, Brett I. [Full Text]; Grobgeld, Dov [Abstract] [Full Text]; Grude, Matthias [Abstract] [Full Text]; Gur, David [Abstract] [Full Text]
H: Hahn, Peter F. [Abstract] [Full Text]; Halpern, Elkan [Abstract] [Full Text]; Hamawy, Karim [Full Text]; Hamm, Bernd [Abstract] [Full Text]; Harmath, Carla [Full Text]; Heindel, Walter [Abstract] [Full Text]; Helbich, Thomas [Abstract] [Full Text]; Helbich, Thomas H. [Abstract] [Full Text]; Hentrich, Hans-Rainer [Abstract] [Full Text]; Herborn, Christoph U. [Abstract] [Full Text]; Hirota, Tatsuya [Abstract] [Full Text]; Hirsch, Susan H. [Abstract] [Full Text]; Hlawatsch, Alexander [Abstract] [Full Text]; Hoeffel, Jean-Claude [Full Text]; Hogendoorn, Pancras C. W. [Full Text]; Holbert, J. Michael [Abstract] [Full Text]; Hollcraft, Charles [Full Text]; Hong, Seong Sook [Full Text]; Hooper, Frank J. [Abstract] [Full Text]; Hunold, Peter [Abstract] [Full Text]
I: Iida, Shigeharu [Abstract] [Full Text]; Iida, Shigeharu [Abstract] [Full Text]
J: Jackson, Catherine A. [Abstract] [Full Text]; Jeffery, Robert F. [Abstract] [Full Text]; Jentzen, Walter [Abstract] [Full Text]; Jones, Elizabeth [Abstract] [Full Text]; Judmaier, Werner [Abstract] [Full Text]; Juergens, Kai Uwe [Abstract] [Full Text]; Jung, Mi Ran [Full Text]
K: Kalra, Mannudeep K. [Abstract] [Full Text]; Kalra, Mannudeep K. [Full Text]; Kaplan, Keith J. [Full Text]; Kato, Takeharu [Abstract] [Full Text]; Kato, Takeharu [Abstract] [Full Text]; Katz, Douglas S. [Full Text]; Katz, Douglas S. [Abstract] [Full Text]; Kaude, Juri V. [Full Text]; Kelcz, Frederick [Abstract] [Full Text]; Kim, Ellen Ai-Rhan [Full Text]; Kim, Hyun Jin [Full Text]; Kim, Ki Soo [Full Text]; Kim, Seong Chul [Full Text]; Kirchin, Miles A. [Abstract] [Full Text]; Klabunde, Carrie N. [Abstract] [Full Text]; Knopp, Michael V. [Abstract] [Full Text]; Ko, Kang Suk [Full Text]; Ko, Seog Wan [Full Text]; Krinsky, Glenn A. [Abstract] [Full Text]; Kroencke, Thomas J. [Abstract] [Full Text]; Kurtaran, Amir [Abstract] [Full Text]
L: Laengle, Friedrich [Abstract] [Full Text]; Langlotz, Curtis [Abstract] [Full Text]; Larsen, Carl [Full Text]; Lauenstein, Thomas C. [Abstract] [Full Text]; Lauffer, Randall B. [Abstract] [Full Text]; Lebrun, Fréderic [Full Text]; Lee, Vivian S. [Abstract] [Full Text]; Leyendecker, John R. [Full Text]; Liang, Luxia [Abstract] [Full Text]; Liberman, Laura [Full Text]; Liberman, Laura [Abstract] [Full Text]; Liebeskind, Amy [Abstract] [Full Text]; Liebeskind, Marc E. [Abstract] [Full Text]; Lin, Dennis C. [Abstract] [Full Text]; Linnau, Ken F. [Abstract] [Full Text]; Lucey, Brian C. [Abstract] [Full Text]; Lyburn, Iain [Full Text]; Lyburn, Iain [Full Text]
M: Magee, Thomas [Full Text]; Maher, Michael M. [Abstract] [Full Text]; Maher, Michael M. [Abstract] [Full Text]; Mair, Michael Helmuth [Abstract] [Full Text]; Mann, Frederick A. [Abstract] [Full Text]; Marchal, Guy [Abstract] [Full Text]; Maston, Keith [Abstract] [Full Text]; Mazzie, Joseph P. [Full Text]; McGraw, Peter [Abstract] [Full Text]; McShane, John M. [Abstract] [Full Text]; Merritt, Christopher R. B. [Abstract] [Full Text]; Misselwitz, Bernd [Abstract] [Full Text]; Moinzadeh, Alireza [Full Text]; Monnier-Cholley, L. [Full Text]; Morris, Elizabeth A. [Full Text]; Mueller, Peter R. [Abstract] [Full Text]; Mueller, Stefan P. [Abstract] [Full Text]; Munk, Peter L. [Full Text]; Munk, Peter L. [Full Text]
N: Nakamura, Toshiyuki [Abstract] [Full Text]; Nakamura, Toshiyuki [Abstract] [Full Text]; Nazarian, Levon N. [Abstract] [Full Text]; Nielsen, Ingrid [Full Text]; Nishimura, Tsunehiko [Abstract] [Full Text]; Nishimura, Tsunehiko [Abstract] [Full Text]
O: O'Connell, John X. [Full Text]; O'Kane, Patrick L. [Abstract] [Full Text]; Obermann, Willem R. [Full Text]; Oda, Yoshinao [Full Text]; Olden, Kevin W. [Abstract] [Full Text]; Olmsted, William W. [Abstract] [Full Text]; Olson, Mary C. [Full Text]; Opitz, Christian [Abstract] [Full Text]
P: Pacharn, Preeyacha [Abstract] [Full Text]; Pandharipande, Pari V. [Abstract] [Full Text]; Parker, Laurence [Abstract] [Full Text]; Pattynama, Peter M. T. [Abstract] [Full Text]; Pennell, Dudley J. [Abstract] [Full Text]; Pfarl, Georg [Abstract] [Full Text]; Pi, Soo Young [Full Text]; Pickhardt, Perry J. [Full Text]; Pinto, Clinton H. [Full Text]; Poe, Stacy A. [Abstract] [Full Text]; Pollak, Yale [Full Text]; Posniak, Harold V. [Full Text]; Prasad, Srinivasa [Full Text]; Proto, Anthony V. [Abstract] [Full Text]; Provenzale, James M. [Abstract] [Full Text]
R: Rademakers, Frank E. [Full Text]; Reimer, Peter [Abstract] [Full Text]; Reiner, Bruce I. [Abstract] [Full Text]; Reuben, David B. [Abstract] [Full Text]; Reuss, Peter M. [Abstract] [Full Text]; Riedl, Christopher C. [Abstract] [Full Text]; Rockette, Howard E. [Abstract] [Full Text]; Rofsky, Neil M. [Abstract] [Full Text]; Rogers, Lee F. [Full Text]; Rosen, Robert J. [Abstract] [Full Text]; Rubens, Deborah J. [Full Text]; Rudas, Margaretha [Abstract] [Full Text]; Ruehm, Stephan G. [Abstract] [Full Text]; Rusch, David [Full Text]; Ryan, Mark [Abstract] [Full Text]
S: Saad, Wael [Full Text]; Sabin, Georg V. [Abstract] [Full Text]; Saini, Sanjay [Full Text]; Saini, Sanjay [Abstract] [Full Text]; Sartori, Sergio [Full Text]; Schibany, Nadja [Abstract] [Full Text]; Schima, Wolfgang [Abstract] [Full Text]; Schmidt, Marcus [Abstract] [Full Text]; Schmook, Maria T. [Abstract] [Full Text]; Schneider, Günther [Abstract] [Full Text]; Schüler, Walter O. [Abstract] [Full Text]; Siegel, Eliot L. [Abstract] [Full Text]; Silverman, Stuart G. [Abstract] [Full Text]; Slavotinek, John P. [Abstract] [Full Text]; Spieth, Michael E. [Full Text]; Spinazzi, Alberto [Abstract] [Full Text]; Stattaus, Joerg [Abstract] [Full Text]; Stein, Leonard B. [Full Text]; Sumkin, Jules H. [Abstract] [Full Text]; Sundaram, Murali [Full Text]
T: Taminiau, Anthonie H. M. [Full Text]; Tanaka, Osamu [Abstract] [Full Text]; Tassinari, Davide [Full Text]; Taupitz, Matthias [Abstract] [Full Text]; Taylor, George A. [Full Text]; Teifke, Andrea [Abstract] [Full Text]; Teng, Gao J. [Abstract] [Full Text]; Thelen, Manfred [Abstract] [Full Text]; Torchia, Mark G. [Abstract] [Full Text]; Torreggiani, William [Full Text]; Trevisani, Lucio [Full Text]; Tubiana, J. M. [Full Text]
V: Vanderschueren, Geert M. [Full Text]; Verrall, Geoffrey M. [Abstract] [Full Text]; Voci, Susan L. [Full Text]; Vogt, Florian M. [Abstract] [Full Text]
W: Wagner, Teresa [Abstract] [Full Text]; Wasser, Martin N. [Abstract] [Full Text]; Weinreb, Jeffrey C. [Abstract] [Full Text]; Wendum, D. [Full Text]; White, Lawrence [Full Text]; Wichter, Thomas [Abstract] [Full Text]; Wolff, Steven D. [Full Text]; Wrba, Friedrich [Abstract] [Full Text]
Y: Yamagami, Takuji [Abstract] [Full Text]; Yamagami, Takuji [Abstract] [Full Text]; Yoon, Chong Hyun [Full Text]
Z: Zhuang, Zhen W. [Abstract] [Full Text]