AJR -- Index by Author (Mar 2004; Volume 182, Number 3)

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Index by Author: 1 March 2004; 182 (3) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbara, Suhny [Abstract] [Full Text]; Abrams, Gordon [Abstract] [Full Text]; Agildere, A. Muhtesem [Abstract] [Full Text]; Anderson, Melissa [Abstract] [Full Text]; Anderson, Suzanne E. [Abstract] [Full Text]; Ando, Yumiko [Abstract] [Full Text]; Andrews, Gordon [Full Text]; Aschoff, Andrik J. [Full Text]; Ashizawa, Kazuto [Full Text]; Au-Yeung, Kai Ming [Abstract] [Full Text]; Avni, Fred E. [Abstract] [Full Text]; Aytekin, Cuneyt [Abstract] [Full Text]
B: Balthazar, Emil J. [Abstract] [Full Text]; Bamberger, P. [Abstract] [Full Text]; Barrett, T. J. [Full Text]; Beall, Douglas P. [Full Text]; Becette, V. [Full Text]; Benli, U. Sibel [Abstract] [Full Text]; Bennett, Genevieve L. [Abstract] [Full Text]; Beppu, Yasuo [Abstract] [Full Text]; Berlin, Leonard [Full Text]; Berman, Claudia G. [Abstract] [Full Text]; Bhalla, Sanjeev [Abstract] [Full Text]; Birnbaum, Bernard A. [Abstract] [Full Text]; Blake, Meghan E. [Full Text]; Bluemke, David A. [Abstract] [Full Text]; Bodner, Gerd [Full Text]; Bogaert, Jan [Full Text]; Boiselle, P. M. [Abstract] [Full Text]; Boiselle, Phillip M. [Full Text]; Bonel, Harald M. [Abstract] [Full Text]; Borders, R. [Abstract] [Full Text]; Brady, Thomas J. [Abstract] [Full Text]; Brambs, Hans-Juergen [Full Text]; Breil, Stéphane [Abstract] [Full Text]; Brent, Robert L. [Full Text]; Brizi, M. G. [Full Text]; Broemeling, Lyle D. [Abstract] [Full Text]; Bronstein, Yulia Lisenko [Abstract] [Full Text]; Brookeman, James R. [Full Text]; Brugières, Pierre [Abstract] [Full Text]; Buchbinder, S. S. [Abstract] [Full Text]; Burrows, Patricia E. [Abstract] [Full Text]; Byrne, John Gerald [Full Text]
C: Can, Ufuk [Abstract] [Full Text]; Casas, J. Darío [Abstract] [Full Text]; Cassart, Marie [Abstract] [Full Text]; Catullo, Victor [Abstract] [Full Text]; Chan, David Y. [Abstract] [Full Text]; Charnsangavej, Chusilp [Abstract] [Full Text]; Chen, Min-Chi [Full Text]; Chen, Wei-Jen [Full Text]; Cheng, Pui Wai [Abstract] [Full Text]; Cherel, P. [Full Text]; Choi, Haesun [Abstract] [Full Text]; Clark, Robert A. [Abstract] [Full Text]; Cleary, Karen R. [Abstract] [Full Text]; Costes, V. [Full Text]; Cuadras, Patricia [Abstract] [Full Text]
D: David, Cynthia [Abstract] [Full Text]; Davis, Steven W. [Full Text]; De Maulmont, C. [Full Text]; De Monaco, Damir [Abstract] [Full Text]; Díaz, Rocío [Abstract] [Full Text]; Dodd, Gerald D., III [Abstract] [Full Text]; Dubois, Josée [Abstract] [Full Text]; DuBrow, Ronelle A. [Abstract] [Full Text]; Dymarkowski, Steven [Full Text]
E: Ebrahim, Farhad S. [Abstract] [Full Text]; Eisenhuber, Edith [Abstract] [Full Text]; El Khoury, M. [Full Text]; El-Khoury, Georges Y. [Full Text]; Emby, D. J. [Full Text]
F: Fallah, Juliet H. [Abstract] [Full Text]; Fennessy, Fiona M. [Abstract] [Full Text]; Fields, S. [Abstract] [Full Text]; Fishman, Elliot K. [Full Text]; Fishman, Steven J. [Abstract] [Full Text]; Forster, Bruce [Full Text]
G: Gagnon, Jean H. [Full Text]; García-García, Lorenzo [Abstract] [Full Text]; Gaskin, Cree M. [Abstract] [Full Text]; Gelbart, Michael S. [Full Text]; Gelman, Haim [Full Text]; Gilula, Louis A. [Full Text]; Glane, P. [Full Text]; Gogate, Adheet [Abstract] [Full Text]; Gold, Richard Palmer [Full Text]; Good, Walter F. [Abstract] [Full Text]; Goske, Marilyn J. [Abstract] [Full Text]; Gotovac, Nikola [Full Text]; Gruber, Hannes [Full Text]; Gur, David [Abstract] [Full Text]; Gutierrez, Fernando R. [Abstract] [Full Text]
H: Hagay, C. [Full Text]; Hague, Cameron [Full Text]; Hahn, Winnie Y. [Full Text]; Haider, M. A. [Abstract] [Full Text]; Hall, Michelle [Abstract] [Full Text]; Halsted, Mark J. [Full Text]; Hamilton, P. [Full Text]; Hanbidge, A. [Abstract] [Full Text]; Hasegawa, I. [Abstract] [Full Text]; Hasegawa, Tadashi [Abstract] [Full Text]; Hatabu, H. [Abstract] [Full Text]; Hayashi, Kuniaki [Full Text]; Hayes, Curtis W. [Abstract] [Full Text]; Heine, John J. [Abstract] [Full Text]; Heinz, Gertraud [Abstract] [Full Text]; Hellström, Mikael [Abstract] [Full Text]; Helms, Clyde A. [Abstract] [Full Text]; Hersh, Marla R. [Abstract] [Full Text]; Hewson, Mariana G. [Abstract] [Full Text]; Hildebolt, Charles F. [Abstract] [Full Text]; Hoffmann, Martin H. K. [Full Text]; Hofmann, Lawrence [Full Text]; Holmvang, Godtfred [Abstract] [Full Text]; Homolka, Peter [Abstract] [Full Text]; Horton, Karen M. [Full Text]; Hough, David M. [Full Text]; Hsieh, Ming-Jeng [Full Text]; Hsu, Raymond M. [Abstract] [Full Text]; Hubbard, Linda G. [Abstract] [Full Text]; Huh, Chu Yeop [Abstract] [Full Text]; Hur, Jin [Full Text]; Hurtienne, Yvonne [Abstract] [Full Text]
I: Inampudi, Prasuna [Abstract] [Full Text]; Israel, Gary M. [Full Text]
J: Jacobson, Jon A. [Abstract] [Full Text]; Jamadar, David A. [Abstract] [Full Text]; Jamal, Noriah [Abstract] [Full Text]
K: Kallergi, Maria [Abstract] [Full Text]; Kamel, Ihab [Abstract] [Full Text]; Kamel, Ihab [Full Text]; Kanne, Jeffrey P. [Full Text]; Kassarjian, Ara [Abstract] [Full Text]; Kaur, Harmeet [Abstract] [Full Text]; Kawai, Akira [Abstract] [Full Text]; Kelly, D. M. [Abstract] [Full Text]; Kim, Ki Whang [Full Text]; King, Bernard F. [Full Text]; Kluckert, Thomas [Abstract] [Full Text]; Ko, Sheung-Fat [Full Text]; Ko, Young Tae [Abstract] [Full Text]; Kondo, Yoshiyuki [Abstract] [Full Text]; Kumbasar, Basak [Abstract] [Full Text]; Kwong, Raymond [Full Text]; Kyriakos, Raja [Full Text]
L: Lam, Paul [Abstract] [Full Text]; Lambert, Jarvis [Full Text]; Lambot, M. Alexandra [Abstract] [Full Text]; Lanciego, Carlos [Abstract] [Full Text]; Larson, Paul A. [Full Text]; Lasson, Anders [Abstract] [Full Text]; Leader, Joseph K. [Abstract] [Full Text]; Lederman, R. [Abstract] [Full Text]; Lee, Dong Ho [Abstract] [Full Text]; Lee, Edward Y. [Abstract] [Full Text]; Lee, Hae Kyung [Abstract] [Full Text]; Lee, Ho Kyu [Full Text]; Lee, Jeong Hyun [Full Text]; Lee, K. H. Y. [Abstract] [Full Text]; Lee, Tze-Yu [Full Text]; Lee, Vivian S. [Full Text]; Leichter, I. [Abstract] [Full Text]; Leichter, Jeffrey A. [Abstract] [Full Text]; Leyendecker, John R. [Abstract] [Full Text]; Li, Arthur E. [Abstract] [Full Text]; Li, Jimmy H. C. [Abstract] [Full Text]; Li, Raymond [Abstract] [Full Text]; Lim, Joo Won [Abstract] [Full Text]; Lima, João A. C. [Abstract] [Full Text]; Lin, Jui-Wei [Full Text]; Looi, Lai-Meng [Abstract] [Full Text]; Loyer, Evelyne M. [Abstract] [Full Text]; Luciani, Alain [Abstract] [Full Text]; Ly, Justin Q. [Full Text]
M: Madsen, Mark T. [Full Text]; Maeda, Toru [Abstract] [Full Text]; Mann, F. A. [Full Text]; Mann, Frederick A. [Full Text]; Mariscal, Antonio [Abstract] [Full Text]; Marjan, Domagoj [Full Text]; Masselli, G. [Full Text]; Massez, Anne [Abstract] [Full Text]; Mathieu, Didier [Abstract] [Full Text]; Matsumoto, Shunro [Abstract] [Full Text]; McLean, Donald [Abstract] [Full Text]; Mesurolle, Benoît [Full Text]; Metens, Thierry [Abstract] [Full Text]; Mettler, Fred A. [Full Text]; Mignon, François [Full Text]; Migrino, Raymond Q. [Abstract] [Full Text]; Montgomery, Richard S. [Abstract] [Full Text]; Moosa, Fatimah [Abstract] [Full Text]; Mori, Hiromu [Abstract] [Full Text]; Moriyama, Noriyuki [Abstract] [Full Text]; Mortele, Koenraad J. [Abstract] [Full Text]
N: Ng, Kwan-Hoong [Abstract] [Full Text]; Ng, Shu-Hang [Full Text]; Niederle, Bruno [Abstract] [Full Text]; Novak, B. [Abstract] [Full Text]
O: O'Gara, Patrick Thomas [Full Text]; O'Malley, M. E. [Abstract] [Full Text]; Obuchowski, Nancy [Abstract] [Full Text]; Oh, Joo Hyoung [Abstract] [Full Text]; Okada, Fumito [Abstract] [Full Text]; Ondategui-Parra, Silvia [Abstract] [Full Text]; Ozdemir, F. Nurhan [Abstract] [Full Text]
P: Paltiel, Harriet J. [Abstract] [Full Text]; Park, Mi-Suk [Full Text]; Park, Seong Jin [Abstract] [Full Text]; Peh, Wilfred C. G. [Full Text]; Pickhardt, Perry J. [Full Text]; Power, N. [Full Text]; Prager, Gerhard [Abstract] [Full Text]
R: Rahal, Andres [Abstract] [Full Text]; Rahmouni, Alain [Abstract] [Full Text]; Rando, Felice [Abstract] [Full Text]; Reid, Janet R. [Abstract] [Full Text]; Restaino, G. [Full Text]; Reynolds, David L., Jr. [Abstract] [Full Text]; Romilly, A. Pat [Abstract] [Full Text]; Ros, Pablo [Abstract] [Full Text]; Ruel, Lucile [Abstract] [Full Text]; Rumboldt, Zoran [Full Text]; Ryan, S. [Full Text]; Rypens, Françoise [Abstract] [Full Text]
S: Saini, Sanjay [Abstract] [Full Text]; Sajko, Tomislav [Full Text]; Sakamoto, Ichiro [Full Text]; Satake, Mitsuo [Abstract] [Full Text]; Schatzki, Stefan [Full Text]; Schima, Wolfgang [Abstract] [Full Text]; Schmid, Florian T. [Full Text]; Shi, Heshui [Full Text]; Shindel, Betty [Abstract] [Full Text]; Siegel, Marilyn J. [Abstract] [Full Text]; Siegelman, Stanley S. [Abstract] [Full Text]; Silverman, Stuart G. [Abstract] [Full Text]; Sosnovik, David E. [Abstract] [Full Text]; Souftas, Vasileios D. [Full Text]; Stadler, Alfred [Abstract] [Full Text]; Stanley, Robert J. [Full Text]; Steinbach, Lynne S. [Abstract] [Full Text]; Sueyoshi, Eijun [Full Text]; Svensson, Maria H. [Abstract] [Full Text]
T: Talma, V. [Full Text]; Tarhan, N. Cagla [Abstract] [Full Text]; Tateishi, Ukihide [Abstract] [Full Text]; Tatli, Servet [Full Text]; Taylor, Andrew M. [Full Text]; Tenforde, Thomas S. [Full Text]; Trendell-Smith, Nigel [Abstract] [Full Text]
V: Valderas, Gracia [Abstract] [Full Text]; Van Kerkhove, Filip [Full Text]; Vecchioli, A. [Full Text]; Voegelin, Esther [Abstract] [Full Text]
W: Wan, Yung-Liang [Full Text]; Wei, William Ignace [Abstract] [Full Text]
Y: Yankowitz, Jerome [Full Text]; Yoon, Yup [Abstract] [Full Text]; Yu, Jeong-Sik [Full Text]; Yucel, E. Kent [Full Text]; Yuen, Anthony Po-Wing [Abstract] [Full Text]
Z: Zheng, Bin [Abstract] [Full Text]; Zurakowski, David [Abstract] [Full Text]