AJR -- Index by Author (Jun 2007; Volume 188, Number 6)

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Index by Author: 1 June 2007; 188 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbara, Suhny [Abstract] [Full Text]; Abbara, Suhny [Abstract] [Full Text]; Albisinni, Ugo [Full Text]; Ali, Kaline [Abstract] [Full Text]; Alper, Huntley J. [Abstract] [Full Text]; Altes, Talissa A. [Abstract] [Full Text]; Anderson, Suzanne E. [Abstract] [Full Text]; Aquino, Suzanne L. [Abstract] [Full Text]; Arai, Yasuaki [Full Text]; Arbeláez, Andrés [Abstract] [Full Text]; Asayayama, Yoshiki [Abstract] [Full Text]
B: Bae, Jae Nam [Abstract] [Full Text]; Baird, Geoffrey S. [Full Text]; Banovac, Filip [Abstract] [Full Text]; Barbaras, Larry [Abstract] [Full Text]; Barker, Peter B. [Abstract] [Full Text]; Barkovich, A. James [Full Text]; Beck-Razi, Nira [Full Text]; Beland, Jason C. [Abstract] [Full Text]; Bell, Charlotte [Full Text]; Berlin, Leonard [Full Text]; Bis, Kostaki G. [Abstract] [Full Text]; Bluemke, David A. [Abstract] [Full Text]; Borgstede, James P. [Full Text]; Brace, Chris L. [Abstract] [Full Text]; Bradley, William G., Jr. [Full Text]; Brady, Thomas J. [Abstract] [Full Text]; Branera, Jordi [Abstract] [Full Text]; Brody, Alan S. [Abstract] [Full Text]; Broome, Dale R. [Full Text]; Broome, Dale R. [Full Text]; Broome, Dale R. [Full Text]; Buesing, Karen A. [Abstract] [Full Text]; Burke, Margaret M. [Full Text]; Byun, Jae Ho [Abstract] [Full Text]
C: Cantwell, Colin P. [Full Text]; Carby, Martin R. [Full Text]; Carvalho, Filomena M. [Full Text]; Castillo, Mauricio [Abstract] [Full Text]; Chala, Luciano F. [Full Text]; Chen, Min-Chi [Abstract] [Full Text]; Cho, Eun Yoon [Full Text]; Choi, Eugene [Abstract] [Full Text]; Choi, Eugene K. [Abstract] [Full Text]; Chong, Semin [Full Text]; Chong, Wui K. [Abstract] [Full Text]; Ciminari, Rosanna [Full Text]; Clark, Peter E. [Abstract] [Full Text]; Cohan, Richard H. [Abstract] [Full Text]; Cohen, Emil I. [Abstract] [Full Text]; Collins, David J. [Abstract] [Full Text]; Connell, David A. [Abstract] [Full Text]; Cury, Ricardo C. [Abstract] [Full Text]
D: D'Ambrosio, Nicholas [Abstract] [Full Text]; d'Othee, Bertrand M. Janne [Abstract] [Full Text]; Daniel, Bruce L. [Full Text]; de Barros, Nestor [Full Text]; De Smet, Arthur [Full Text]; Dillman, Jonathan R. [Abstract] [Full Text]; Dodd, Jonathan D. [Abstract] [Full Text]
E: Ellis, James H. [Abstract] [Full Text]; Endo, Erica [Full Text]; Eng, John [Abstract] [Full Text]; Eto, Masatoshi [Full Text]; Eubank, William B. [Abstract] [Full Text]; Eustace, Stephen [Full Text]
F: Falcó, Joan [Abstract] [Full Text]; Fayad, Laura M. [Abstract] [Full Text]; Forman, Howard P. [Full Text]; Fortuño, José R. [Abstract] [Full Text]; Frey, Tina M. [Abstract] [Full Text]; Friedman, Barak [Abstract] [Full Text]; Froelich, Jerry W. [Full Text]; Frush, Donald P. [Abstract] [Full Text]; Fu, Peifen [Abstract] [Full Text]; Fu, Yun-Ching [Abstract] [Full Text]; Fukuda, Mamoru [Abstract] [Full Text]
G: Gaitini, Diana E. [Full Text]; Ganguli, Suvranu [Abstract] [Full Text]; Garvin, A. Julian [Abstract] [Full Text]; Gay, Spencer B. [Abstract] [Full Text]; Gilk, Tobias [Full Text]; Gimbel, J. Rod [Full Text]; Girguis, Mark S. [Full Text]; Girguis, Mark S. [Full Text]; Girguis, Mark S. [Full Text]; Glickerman, David J. [Abstract] [Full Text]; Goldblatt, Jack [Abstract] [Full Text]; Gorantonaki, Akrivi [Abstract] [Full Text]; Gorbachova, Tetyana [Abstract] [Full Text]; Gosbee, John [Full Text]; Gulati, Gurpreet Singh [Full Text]; Gunderman, Richard B. [Full Text]; Gupta, Narainder K. [Full Text]
H: Haims, Andrew H. [Abstract] [Full Text]; Hall, M. Craig [Abstract] [Full Text]; Hasegawa, Tadashi [Full Text]; Heilbrun, Marta E. [Abstract] [Full Text]; Hines, John [Abstract] [Full Text]; Hirakawa, Masakazu [Abstract] [Full Text]; Ho, Lisa M. [Abstract] [Full Text]; Ho Park, Seong [Abstract] [Full Text]; Hoffmann, Udo [Abstract] [Full Text]; Holmvang, Godtfred [Abstract] [Full Text]; Honda, Hiroshi [Full Text]; Honda, Hiroshi [Abstract] [Full Text]; Hoogeveen, Romhild M. [Abstract] [Full Text]; Hughes, Richard J. [Abstract] [Full Text]
I: Ikeda, Debra M. [Full Text]; Inaba, Rikako [Abstract] [Full Text]; Irie, Hiroyuki [Abstract] [Full Text]; Ishigami, Kousei [Abstract] [Full Text]
J: Jacobs, Michael A. [Abstract] [Full Text]; Jan, Sheng-Lin [Abstract] [Full Text]; Jan, Sophia C. [Abstract] [Full Text]; Jinzaki, Masahiro [Full Text]; Johnson, Nathan A. [Abstract] [Full Text]; Jones, Hugh [Abstract] [Full Text]; Jung, Seung Eun [Abstract] [Full Text]
K: Kahn, Charles E., Jr. [Abstract] [Full Text]; Kakihara, Daisuke [Full Text]; Kakihara, Daisuke [Abstract] [Full Text]; Kanal, Emanuel [Full Text]; Kanemaki, Yoshihide [Abstract] [Full Text]; Kanne, Jeffrey P. [Full Text]; Karlik, Stephen J. [Full Text]; Katz, Douglas [Abstract] [Full Text]; Katzberg, Richard W. [Full Text]; Kendall, Sue [Abstract] [Full Text]; Ketzler, Jan R. [Abstract] [Full Text]; Kilian, A. Kristina [Abstract] [Full Text]; Kim, Byung Sik [Abstract] [Full Text]; Kim, Byung-Tae [Full Text]; Kim, Jhingook [Full Text]; Kim, Jin Hyoung [Abstract] [Full Text]; Kim, So Yeon [Abstract] [Full Text]; Kim, Tae Sung [Full Text]; Kim, Tae Won [Abstract] [Full Text]; Kini, Sunil [Abstract] [Full Text]; Kirk, Gerald [Full Text]; Kloeblen, Emily [Abstract] [Full Text]; Koh, Dow-Mu [Abstract] [Full Text]; Kolodny, Gerald M. [Abstract] [Full Text]; Korenaga, Tateo [Abstract] [Full Text]; Krehbiel, Kyle [Abstract] [Full Text]; Krishnan, K. Ranga R. [Abstract] [Full Text]; Kuhni-Kaminski, Ellisa [Full Text]; Kulesza, Piotr [Abstract] [Full Text]; Kuribayashi, Sachio [Full Text]; Kurihara, Yasuyuki [Abstract] [Full Text]
L: Laeseke, Paul F. [Abstract] [Full Text]; Lee, Cheng-Hung [Full Text]; Lee, Fred T., Jr. [Abstract] [Full Text]; Lee, Moon-Gyu [Abstract] [Full Text]; Lee, Rheun-Chuan [Full Text]; Lee, Soon Jin [Abstract] [Full Text]; Lee, Sung Koo [Abstract] [Full Text]; Lee, Tain [Abstract] [Full Text]; Lee, Vivian S. [Abstract] [Full Text]; Leipsic, Jonathon A. [Full Text]; Lester, James W., Jr. [Full Text]; Lim, Jae Hoon [Abstract] [Full Text]; Lim, Ruth P. [Abstract] [Full Text]; Lin, Yu-Min [Full Text]; Livingston, Robert B. [Full Text]; Loff, Steffan [Abstract] [Full Text]; Lomas, David [Abstract] [Full Text]; Londoño, Ana C. [Abstract] [Full Text]; Lookstein, Robert A. [Abstract] [Full Text]; Lucey, Leonard [Full Text]
M: Maas, Mario [Abstract] [Full Text]; MacFall, James R. [Abstract] [Full Text]; Maeda, Ichiro [Abstract] [Full Text]; Maeda, Tetsuo [Full Text]; Maher, Toby M. [Full Text]; Maki, Jeffrey H. [Abstract] [Full Text]; Malaguti, Cristina [Full Text]; Mankoff, David A. [Full Text]; Marcus, Jeffrey [Abstract] [Full Text]; Massuet, Anna [Abstract] [Full Text]; Matsuura, Shuji [Full Text]; McAdams, H. Page [Full Text]; Medina, Elcy [Abstract] [Full Text]; Millan, Juan A. [Abstract] [Full Text]; Minoshima, Satoshi [Full Text]; Moore, Meredith [Abstract] [Full Text]; Morcos, Sameh K. [Full Text]; Morrison, William B. [Abstract] [Full Text]; Mukundan, Srinivasan, Jr. [Abstract] [Full Text]
N: Nakajima, Yasuo [Abstract] [Full Text]; Neff, K. Wolfgang [Abstract] [Full Text]; Newatia, Amit [Abstract] [Full Text]; Ng, Yee-Yung [Full Text]; Nikolic, Boris [Abstract] [Full Text]; Nyenhuis, John [Full Text]
O: O'Byrne, John [Full Text]; Ogilvie, Jennifer B. [Abstract] [Full Text]; Ojima, Hidenori [Full Text]; Okamoto, Kyoko [Abstract] [Full Text]; Omuro, Masami [Abstract] [Full Text]
P: Palmer, Matthew R. [Abstract] [Full Text]; Papailiou, John [Abstract] [Full Text]; Parag, Yoav [Full Text]; Park, Cheol Min [Abstract] [Full Text]; Park, Mi-Suk [Abstract] [Full Text]; Parker, J. Anthony [Abstract] [Full Text]; Paulson, Erik K. [Full Text]; Paulson, Erik K. [Abstract] [Full Text]; Payne, Martha E. [Abstract] [Full Text]; Pelage, Jean-Pierre [Abstract] [Full Text]; Perendreu, Joan [Abstract] [Full Text]; Pinho, Marco C. [Full Text]; Pochaczevsky, Rubem [Full Text]; Provenzale, James M. [Abstract] [Full Text]
R: Rimola, Jordi [Abstract] [Full Text]; Rimondi, Eugenio [Full Text]; Robertson, Patricia L. [Abstract] [Full Text]; Rodríguez, Margarita [Abstract] [Full Text]
S: Sala, Evis [Abstract] [Full Text]; Sampson, Lisa A. [Abstract] [Full Text]; Sass, Nancy [Full Text]; Schaefer, Daniel J. [Full Text]; Schaible, Thomas [Abstract] [Full Text]; Schatzki, Stefan C. [Full Text]; Schöder, Heiko [Abstract] [Full Text]; Schwope, Ryan B. [Abstract] [Full Text]; Sebek-Scoumis, Elizabeth A. [Full Text]; Senior, Emma [Abstract] [Full Text]; Shen, Shu-Huei [Full Text]; Shin, Ji Hoon [Abstract] [Full Text]; Siebenrock, Klaus A. [Abstract] [Full Text]; Siegel, David [Abstract] [Full Text]; Smith, Clare S. [Abstract] [Full Text]; Song, Ho-Young [Abstract] [Full Text]; Sonobe, Tomoyoshi [Abstract] [Full Text]; Soudack, Michalle [Full Text]; Southwick, Andrew [Abstract] [Full Text]; Souza, Felipe [Full Text]; Spies, James B. [Abstract] [Full Text]; Sporn, Thomas A. [Full Text]; Srichai, Monvadi B. [Abstract] [Full Text]; Stanley, Robert J. [Full Text]; Steffens, David C. [Abstract] [Full Text]; Steinbach, Lynne S. [Full Text]; Stolin, Alexander V. [Abstract] [Full Text]; Strouse, Peter J. [Abstract] [Full Text]; Sugimura, Kazuro [Full Text]; Sumargo, Sabrina [Abstract] [Full Text]; Suzuki, Atsuko [Abstract] [Full Text]; Syvanthong, Chockeo [Abstract] [Full Text]
T: Takemura, Atsushi [Abstract] [Full Text]; Tal, Ilan [Abstract] [Full Text]; Talenfeld, Adam D. [Abstract] [Full Text]; Tannast, Moritz [Abstract] [Full Text]; Tateishi, Ukihide [Full Text]; Taylor, Warren D. [Abstract] [Full Text]; Tham, Jacques C. [Abstract] [Full Text]; Thao, Cheng [Abstract] [Full Text]; the ACR Blue Ribbon Panel on MR Safety, [Full Text]; Thompson, William M. [Abstract] [Full Text]; Thomsen, Henrik S. [Full Text]; Triantopoulou, Charicleia [Abstract] [Full Text]; Trotta, Brian M. [Abstract] [Full Text]; Tsai, I-Chen [Abstract] [Full Text]; Tsai, Wei-Lin [Abstract] [Full Text]; Tsalafoutas, Ioannis A. [Abstract] [Full Text]; Tsapaki, Virginia [Abstract] [Full Text]; Tsuchiya, Keiji [Abstract] [Full Text]; Tublin, Mitchell E. [Abstract] [Full Text]; Tuite, Michael [Full Text]; Tzeng, Chung-Yuh [Full Text]
V: Van den Bosch, Maurice A. A. J. [Full Text]; Van Moore, Arl, Jr. [Full Text]
W: Wachsberg, Ronald H. [Abstract] [Full Text]; Wakely, Suzanne [Abstract] [Full Text]; Wang, Chung-Chi [Abstract] [Full Text]; Wang, Jin-hong [Full Text]; Wang, Page Inman [Abstract] [Full Text]; Wang, Pei-jun [Full Text]; Weaver, Leroy [Abstract] [Full Text]; Weber, Kristin L. [Abstract] [Full Text]; Weeks, Susan M. [Abstract] [Full Text]; Weinreb, Jeffrey [Full Text]; Wilcox, Pamela [Full Text]; Wile, Geoffrey E. [Abstract] [Full Text]; Williams, Mark B. [Abstract] [Full Text]; Wilson, Gregory J. [Abstract] [Full Text]; Winter, Thomas C., III [Abstract] [Full Text]; Wu, Jim S. [Abstract] [Full Text]
Y: Yeung, Henry W. D. [Abstract] [Full Text]; Yoshimitsu, Kengo [Full Text]; Yoshimitsu, Kengo [Abstract] [Full Text]; Yoshizumi, Terry [Abstract] [Full Text]
Z: Zagoria, Ronald J. [Abstract] [Full Text]; Zagoria, Ronald J. [Abstract] [Full Text]; Zaremba, Loren A. [Full Text]; Zhao, Xiao-hu [Full Text]